ECE 682

VLSI Test Concepts


Spring 2014
 

 

Innovation Hall 131
Mondays 4:30 to 7:10PM

Course Summary

Broad introduction to basic concepts, techniques, and tools of modern VLSI testing. Fundamentals of defect modeling, fault simulation, design for testability, built-in self-test techniques, and failure analysis. Test economics, physical defects and fault modeling, automated test pattern generation, fault simulation, design for test, built-in self test, memory test, mixed-signal test, Iddq test, boundary scan and related standards, test synthesis, diagnosis and failure analysis, automated test equipment, embedded core test.