Tom Storey has been an Adjunct Professor in the Department of Electrical and Computer Engineering at George Mason University since January, 1999. He received a B.S. in Engineering Physics from Lehigh University in M.S. in Electrical Engineering from Syracuse University and a Ph.D. in Electrical and Computer Engineering from Carnegie Mellon University. He has over 35 years of industry experience in the field of integrated circuit design and design automation and has most recently been Chief Memory Test Engineer at BAE's Space Electronics Division. Awards include IBM's Outstanding Technical Achievement Award, the International Test Conference Best Paper Award, IEEE Computer Society Outstanding Contribution Award, 2 IBM Invention Achievement Awards, and the Semiconductor Research Corporation's Technical Excellence Award.
Houman Homayoun is an Assistant Professor of the Department of Electrical and Computer Engineering at George Mason University. He also holds a joint appointment with the Department of Computer Science.
Prior to joining George Mason University, he spent two years at the University of California, San Diego, as National Science Foundation Computing Innovation (CI) Fellow awarded by the Computing Research Association (CRA) and the Computing Community Consortium (CCC). Houman's research is on power-temperature and reliability-aware memory and processor design optimizations and spans the areas of computer architecture, embedded systems, circuit design, and VLSI-CAD, where he has published more than 30 technical papers on the subject, including some of the earliest work in the field to address the importance of cross-layer power and temperature optimization in memory peripheral circuits.